Certech has acquired a new sputter coater/evaporator for preparing scanning electron microscopy specimens. Sputter coating is used to provide an electrically conductive thin film representative of the surface topography, reduce charging effects and thermal damage, and enhance secondary electron emission. Various metals can be deposited, such as gold or platinum. This instrument can also be used to evaporate carbon conducting coatings for EDX microanalysis, using carbon cords.
Acquisition of a sputter coater/evaporator for SEM observation
Certech has extended analytical platforms allowing the complete characterization of materials (chemical, physical, sensory properties) including structural and surface characterisation: particle size, porosimetry (BET), crystalline structure (XRD), roughness (optical and mechanical profilometer), permeability, surface wettability (contact angle, zeta potential), wear resistance (scratch, abrasimeter), optical microscopy, scanning electronic microscopy FEG-SEM-EDX, cryo-ultramicrotomy, transmission electronic microscopy EFTEM.